Atomic force microscopy /

Atomic force microscopy /

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Bibliographic Details
Author / Creator:	Eaton, Peter Jonathan.
Imprint:	Oxford ; New York : Oxford University Press, 2010.
Description:	viii, 248 p. : ill. (some col.) ; 26 cm.
Language:	English
Subject:	Atomic force microscopy. Atomic force microscopy.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/8296702

Hidden Bibliographic Details
Other authors / contributors:	West, Paul.
ISBN:	9780199570454 (hbk.) 0199570450 (hbk.)
Notes:	Includes bibliographical references (p. [201]-240) and index.
Summary:	Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Table of Contents:

Preface
Introduction
1.1. Background to AFM
1.2. AFM today
2. AFM instrumentation
2.1. Basic concepts in AFM instrumentation
2.2. The AFM stage
2.3. AFM electronics
2.4. Acquisition software
2.5. AFM cantilevers and probes
2.6. AFM instrument environment
2.7. Scanning environment
3. AFM modes
3.1. Topographic modes
3.2. Non-topographic modes
3.3. Surface modification
4. Measuring AFM images
4.1. Sample preparation for AFM
4.2. Measuring AFM images in contact mode
4.3. Measuring AFM images in oscillating modes
4.4. High-resolution imaging
4.5. Force curves
5. AFM image processing and analysis
5.1. Processing AFM images
5.2. Displaying AFM images
5.3. Analysing AFM images
6. AFM image artefacts
6.1. Probe artefacts
6.2. Scanner artefacts
6.3. Image processing artefacts
6.4. Vibration noise
6.5. Noise from other sources
6.6. Other artefacts
7. Applications of AFM
7.1. AFM applications in physical and materials sciences
7.2. AFM applications in nanotechnology
7.3. Biological applications of AFM
7.4. Industrial AFM applications
Appendix A. AFM standards
Appendix B. Scanner calibration and certification procedures
Appendix C. Third party AFM software
Bibliography
Index