Atomic force microscopy /
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Author / Creator: | Eaton, Peter Jonathan. |
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Imprint: | Oxford ; New York : Oxford University Press, 2010. |
Description: | viii, 248 p. : ill. (some col.) ; 26 cm. |
Language: | English |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8296702 |
Table of Contents:
- Preface
- Introduction
- 1.1. Background to AFM
- 1.2. AFM today
- 2. AFM instrumentation
- 2.1. Basic concepts in AFM instrumentation
- 2.2. The AFM stage
- 2.3. AFM electronics
- 2.4. Acquisition software
- 2.5. AFM cantilevers and probes
- 2.6. AFM instrument environment
- 2.7. Scanning environment
- 3. AFM modes
- 3.1. Topographic modes
- 3.2. Non-topographic modes
- 3.3. Surface modification
- 4. Measuring AFM images
- 4.1. Sample preparation for AFM
- 4.2. Measuring AFM images in contact mode
- 4.3. Measuring AFM images in oscillating modes
- 4.4. High-resolution imaging
- 4.5. Force curves
- 5. AFM image processing and analysis
- 5.1. Processing AFM images
- 5.2. Displaying AFM images
- 5.3. Analysing AFM images
- 6. AFM image artefacts
- 6.1. Probe artefacts
- 6.2. Scanner artefacts
- 6.3. Image processing artefacts
- 6.4. Vibration noise
- 6.5. Noise from other sources
- 6.6. Other artefacts
- 7. Applications of AFM
- 7.1. AFM applications in physical and materials sciences
- 7.2. AFM applications in nanotechnology
- 7.3. Biological applications of AFM
- 7.4. Industrial AFM applications
- Appendix A. AFM standards
- Appendix B. Scanner calibration and certification procedures
- Appendix C. Third party AFM software
- Bibliography
- Index