Application of a new goodness-of-fit plot procedure to SAT and TOEFL item type data /

Application of a new goodness-of-fit plot procedure to SAT and TOEFL item type data /

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Bibliographic Details
Author / Creator:Eignor, Daniel R.
Imprint:Princeton, N.J. : Educational Testing Service, 1986.
Description:28 p.
Language:English
Series:Research report - Educational Testing Service ; RR-86-47
Research report (Educational Testing Service) ; RR-86-47.
Subject:
SAT (Educational test.
Test of English as a Foreign Language.
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/867976
Hidden Bibliographic Details
Other authors / contributors:Golub-Smith, Marna.
Wingersky, Marilyn S.
Description
Physical Description:28 p.

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