High-speed VLSI interconnections /

High-speed VLSI interconnections /

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Bibliographic Details
Author / Creator:	Goel, Ashok K., 1953-
Edition:	2nd ed.
Imprint:	Hoboken, N.J. : Wiley-Interscience : IEEE Press, c2007.
Description:	1 online resource (xix, 407 p.) : ill.
Language:	English
Series:	Wiley series in microwave and optical engineering Wiley series in microwave and optical engineering.
Subject:	Very high speed integrated circuits -- Mathematical models. Very high speed integrated circuits -- Defects -- Mathematical models. Integrated circuits -- Very large scale integration -- Computer simulation. Semiconductors -- Junctions. Integrated circuits -- Very large scale integration -- Computer simulation. Semiconductors -- Junctions. Very high speed integrated circuits -- Mathematical models.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/8680164

Hidden Bibliographic Details
ISBN:	9780470165973 0470165979 9780470165966 (electronic bk.) 0470165960 (electronic bk.) 9780471780465 (cloth) 0471780464 (cloth)
Notes:	Includes bibliographical references and index.
Other form:	Print version: Goel, Ashok K., 1953- High-speed VLSI interconnections. 2nd ed. Hoboken, N.J. : Wiley-Interscience : IEEE Press, c2007 9780471780465 0471780464
Standard no.:	10.1002/9780470165973

Description
Summary:	This Second Edition focuses on emerging topics and advances in the field of VLSI interconnections<br> <br> In the decade since High-Speed VLSI Interconnections was first published, several major developments have taken place in the field. Now, updated to reflect these advancements, this Second Edition includes new information on copper interconnections, nanotechnology circuit interconnects, electromigration in the copper interconnections, parasitic inductances, and RLC models for comprehensive analysis of interconnection delays and crosstalk.<br> <br> Each chapter is designed to exist independently or as a part of one coherent unit, and several appropriate exercises are provided at the end of each chapter, challenging the reader to gain further insight into the contents being discussed. Chapter subjects include:<br> <br> <br> Preliminary Concepts<br> <br> <br> Parasitic Resistances, Capacitances, and Inductances<br> <br> <br> Interconnection Delays<br> <br> <br> Crosstalk Analysis<br> <br> <br> Electromigration-Induced Failure Analysis<br> <br> <br> Future Interconnections<br> <br> High-Speed VLSI Interconnections, Second Edition is an indispensable reference for high-speed VLSI designers, RF circuit designers, and advanced students of electrical engineering.
Physical Description:	1 online resource (xix, 407 p.) : ill.
Bibliography:	Includes bibliographical references and index.
ISBN:	9780470165973 0470165979 9780470165966 0470165960 9780471780465 0471780464