X-ray and neutron reflectivity : principles and applications /

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Bibliographic Details
Edition:[2nd ed.].
Imprint:Berlin : Springer, c2009.
Description:1 online resource (xiv, 348 p.) : ill. (some col.)
Language:English
Series:Lecture notes in physics, 0075-8450 ; 770
Lecture notes in physics ; 770.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8869370
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Other authors / contributors:Daillant, J. (Jean)
Gibaud, Alain, 1956-
ISBN:9783540885887 (e-ISBN)
3540885889 (e-ISBN)
9783540885870 (hbk.)
3540885870 (hbk.)
Notes:Previous ed.: 1999.
Includes bibliographical references and index.
Description based on print version record.
Other form:Print version: X-ray and neutron reflectivity. 2nd ed. Berlin ; London : Springer, 2009 9783540885870
Table of Contents:
  • The Interaction of X-rays (and neutrons) with matter / F. de Bergevin
  • Statistical aspects of wave scattering at rough surfaces / A. Sentenac and J. Daillant
  • Specular reflectivity from smooth and rough surfaces / A. Gibaud and G. Vignaud
  • Diffuse scattering / J. Daillant, S. Mora and A. Sentenac
  • Neutron reflectometry / C. Fermon, F. Ott and A. Menelle
  • X-ray reflectivity by rough multilayers / T. Baumbach and P. Mikulík
  • Grazing incidence small-angle X-ray scattering from nanostructures / R. Lazzari.