Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Author / Creator:Egerton, R. F.
Imprint:New York : Springer Science+Business Media, c2005.
Description:1 online resource (xii, 202 p.) : ill.
Language:English
Subject:
Electron microscopy.
Microscopy, Electron.
Physics.
Materials.
Microscopy.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8876161
Hidden Bibliographic Details
ISBN:9780387260167
0387260161
Notes:Includes bibliographical references (p. [195]-196) and index.
Description based on print version record.
Summary:Provides an introduction to the theory and practice of electron microscopy. Aimed at undergraduates who need to learn how the basic principles of physics are applied in the area of science and technology, this book is also useful for graduates, university teachers and researchers who need a text that deals with the basic principles of microscopy.
Other form:Print version: Egerton, R.F. Physical principles of electron microscopy. New York : Springer Science+Business Media, c2005 0387258000 9780387258003

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