Bayesian reliability /

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Bibliographic Details
Imprint:New York, NY : Springer, c2008.
Description:1 online resource (xvi, 436 p.) : ill.
Language:English
Series:Springer series in statistics
Springer series in statistics.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/8886885
Hidden Bibliographic Details
Other authors / contributors:Hamada, Michael, 1955-
ISBN:9780387779508
0387779507
9780387779485
0387779485
Notes:Includes bibliographical references (p. [413]-425) and indexes.
Description based on print version record.
Other form:Print version: Bayesian reliability. New York, NY : Springer, c2008 9780387779485 0387779485
Table of Contents:
  • Reliability concepts
  • Bayesian inference
  • Advanced Bayesian modeling and computational methods
  • Component reliability
  • System reliability
  • Repairable system reliability
  • Regression models in reliability
  • Using degradation data to assess reliability
  • Planning for reliability data collection
  • Assurance testing.