Predictive technology model for robust nanoelectronic design /
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| Author / Creator: | Cao, Yu. |
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| Imprint: | New York : Springer Science+Business Media, LLC, c2011. |
| Description: | 1 online resource (xv, 173 p.) : ill. (some col.) |
| Language: | English |
| Series: | Integrated circuits and systems, 1558-9412 Integrated Circuits and Systems. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/8900396 |
| Summary: | Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling. |
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| Physical Description: | 1 online resource (xv, 173 p.) : ill. (some col.) |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781461404453 1461404452 9781461404446 |
| ISSN: | 1558-9412 |