X-ray fluorescence spectrometry /

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Bibliographic Details
Author / Creator:Jenkins, Ron, 1932-
Imprint:New York : J. Wiley, c1988.
Description:x, 175 p. : ill. ; 24 cm.
Language:English
Series:Chemical analysis v. 99
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/933401
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ISBN:0471836753
Notes:"A Wiley-Interscience publication."
Includes bibliographies and index.
Table of Contents:
  • Production and Properties X-Rays
  • Industrial Applications of X-Rays
  • X-Ray Diffraction
  • X-Ray Spectra
  • History and Development of X-Ray Fluorescence Spectrometry
  • Instrumentation for X-Ray Spectrometry
  • Comparison of Wavelength and Energy Dispersive Spectrometers
  • More Recent Trends in X-Ray Fluorescence Instrumentation
  • Specimen Preparation and Presentation
  • Use of X-Ray Spectrometry for Qualitative Analysis
  • Considerations in Quantitative X-Ray Fluorescence Analysis
  • Quantitative Procedures in X-Ray Fluorescence Analysis
  • Applications of X-Ray Methods
  • Index