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19950907000000.0 |
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890720s1989 wb b 00110 eng u |
010 |
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|a 88035563
|
020 |
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|a 0387504990 (U.S. alk. paper)
|
035 |
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|a (ICU)BID12120671
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|a (OCoLC)18959918
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|a DLC
|c DLC
|d ICU
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041 |
0 |
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|a eng
|
050 |
0 |
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|a QH212.T7
|b R43 1989
|
082 |
0 |
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|a 502/.8/25
|2 19
|
100 |
1 |
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|a Reimer, Ludwig,
|d 1928-
|0 http://id.loc.gov/authorities/names/n83160359
|1 http://viaf.org/viaf/65163372
|
245 |
1 |
0 |
|a Transmission electron microscopy :
|b physics of image formation and microanalysis /
|c Ludwig Reimer.
|
250 |
|
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|a 2nd ed.
|
260 |
0 |
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|a Berlin ;
|a New York :
|b Springer-Verlag,
|c c1989.
|
300 |
|
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|a xiii, 547 p. :
|b ill. ;
|c 24 cm.
|
336 |
|
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|a text
|b txt
|2 rdacontent
|0 http://id.loc.gov/vocabulary/contentTypes/txt
|
337 |
|
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|a unmediated
|b n
|2 rdamedia
|0 http://id.loc.gov/vocabulary/mediaTypes/n
|
338 |
|
|
|a volume
|b nc
|2 rdacarrier
|0 http://id.loc.gov/vocabulary/carriers/nc
|
440 |
|
0 |
|a Springer series in optical sciences
|v v. 36
|
504 |
|
|
|a Includes bibliographical references and index.
|
650 |
|
0 |
|a Transmission electron microscopes
|0 http://id.loc.gov/authorities/subjects/sh85042220
|
650 |
|
7 |
|a Transmission electron microscopy.
|2 fast
|0 http://id.worldcat.org/fast/fst01154860
|
903 |
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|a HeVa
|
929 |
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|a cat
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|s 4732b702-d1ed-5553-81ec-3bc8c6da4e57
|
928 |
|
|
|t Library of Congress classification
|a QH212.T7R430 1989
|l JCL
|c JCL-Sci
|i 1598525
|
927 |
|
|
|t Library of Congress classification
|a QH212.T7R430 1989
|l JCL
|c JCL-Sci
|e CRERAR
|b 32752724
|i 2202435
|