Analog IC reliability in nanometer CMOS /
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Author / Creator: | Maricau, Elie. |
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Imprint: | New York, NY : Springer, c2013. |
Description: | 1 online resource. |
Language: | English |
Series: | Analog circuits and signal processing Analog Circuits and Signal Processing Series. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/9849550 |
Table of Contents:
- Introduction
- CMOS Reliability Overview
- Transistor Aging Compact Modeling
- Background on IC Reliability Simulation
- Analog IC Reliability Simulation
- Integrated Circuit Reliability
- Conclusions.