Analog IC reliability in nanometer CMOS /

Analog IC reliability in nanometer CMOS /

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Bibliographic Details
Author / Creator:	Maricau, Elie.
Imprint:	New York, NY : Springer, c2013.
Description:	1 online resource.
Language:	English
Series:	Analog circuits and signal processing Analog Circuits and Signal Processing Series.
Subject:	Linear integrated circuits -- Reliability. Metal oxide semiconductors, Complementary. Linear integrated circuits -- Reliability. Metal oxide semiconductors, Complementary.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/9849550

Hidden Bibliographic Details
Other authors / contributors:	Gielen, Georges.
ISBN:	9781461461630 (electronic bk.) 1461461634 (electronic bk.) 9781461461623
Notes:	Includes bibliographical references and index.
Summary:	This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. · Enables readers to understand long-term reliability of an integrated circuit;· Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes;· Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology;· Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.

Table of Contents:

Introduction
CMOS Reliability Overview
Transistor Aging Compact Modeling
Background on IC Reliability Simulation
Analog IC Reliability Simulation
Integrated Circuit Reliability
Conclusions.