Accelerated testing : statistical models, test plans, and data analyses /

Accelerated testing : statistical models, test plans, and data analyses /

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Bibliographic Details
Author / Creator:	Nelson, Wayne, 1936-
Imprint:	New York : Wiley, c1990.
Description:	xiii, 601 p. : ill. ; 25 cm.
Language:	English
Series:	Wiley series in probability and mathematical statistics. Applied probability and statistics section Wiley series in probability and mathematical statistics. Applied probability and statistics
Subject:	Failure time data analysis Reliability (Engineering) -- Statistical methods Accelerated life testing -- Statistical methods. Accelerated life testing -- Statistical methods. Failure time data analysis. Reliability (Engineering) -- Statistical methods.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/1035721

Hidden Bibliographic Details
ISBN:	0471522775
Notes:	"A Wiley-Interscience publication." Includes bibliographical references.

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Call Number:	QA276.N450 1990
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