Accelerated testing : statistical models, test plans, and data analyses /

Accelerated testing : statistical models, test plans, and data analyses /

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Bibliographic Details
Author / Creator:	Nelson, Wayne, 1936-
Imprint:	New York : Wiley, c1990.
Description:	xiii, 601 p. : ill. ; 25 cm.
Language:	English
Series:	Wiley series in probability and mathematical statistics. Applied probability and statistics section Wiley series in probability and mathematical statistics. Applied probability and statistics
Subject:	Failure time data analysis Reliability (Engineering) -- Statistical methods Accelerated life testing -- Statistical methods. Accelerated life testing -- Statistical methods. Failure time data analysis. Reliability (Engineering) -- Statistical methods.
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/1035721

Hidden Bibliographic Details
ISBN:	0471522775
Notes:	"A Wiley-Interscience publication." Includes bibliographical references.

Table of Contents:

Models for Life Tests with Constant Stress
Graphical Data Analysis
Complete Data and Least Squares Analyses
Censored Data and Maximum Likelihood Methods
Test Plans
Competing Failure Modes and Size Effect
Least-Squares Comparisons for Complete Data
Maximum Likelihood Comparisons for Censored and Other Data
Models and Data Analyses for Step and Varying Stress
Accelerated Degradation
Appendix
References
Index