Field-ion microscopy.

Saved in:
Bibliographic Details
Author / Creator:Bowkett, K. M.
Imprint:Amsterdam, North-Holland Pub. Co., 1970.
Description:x, 257 p. with illus. 23 cm.
Language:English
Series:Defects in crystalline solids v. 2
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/1099190
Hidden Bibliographic Details
Other authors / contributors:Smith, David A. (David Anthony), 1943- joint author.
ISBN:072041752X