Field-ion microscopy.
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| Author / Creator: | Bowkett, K. M. |
|---|---|
| Imprint: | Amsterdam, North-Holland Pub. Co., 1970. |
| Description: | x, 257 p. with illus. 23 cm. |
| Language: | English |
| Series: | Defects in crystalline solids v. 2 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1099190 |
