Anomalous X-ray scattering for materials characterization : atomic-scale structure determination /

Saved in:

Bibliographic Details
Author / Creator:	Waseda, Yoshio.
Imprint:	Berlin ; New York : Springer, ©2002.
Description:	1 online resource (xiii, 214 pages) : illustrations.
Language:	English
Series:	Springer tracts in modern physics, 0081-3869 ; v. 179 Springer tracts in modern physics ; 179.
Subject:	X-rays -- Scattering. X-ray crystallography. X-ray crystallography. X-rays -- Scattering.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11065361

Hidden Bibliographic Details
ISBN:	9783540460084 354046008X 3540434437 9783540434436
Notes:	Includes bibliographical references and index.
Summary:	The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.
Other form:	Print version: Waseda, Yoshio. Anomalous X-ray scattering for materials characterization. Berlin ; New York : Springer, ©2002

Similar Items