X-ray and neutron reflectivity : principles and applications /

Saved in:
Bibliographic Details
Edition:2nd ed.
Imprint:Berlin ; London : Springer, 2009.
Description:1 online resource (xiv, 348 pages) : illustrations (some color).
Language:English
Series:Lecture notes in physics ; 770
Lecture notes in physics ; 770.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11071594
Hidden Bibliographic Details
Other authors / contributors:Daillant, J. (Jean)
Gibaud, Alain, 1956-
ISBN:9783540885887
3540885889
9783540885870
3540885870
Notes:Previous edition: 1999.
Includes bibliographical references and index.
Print version record.
Summary:This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and the scattering of radiation is considered in detail. Specular reflectivity and diffuse scattering are discussed next , in chapters 3 and 4 . The approximations are rigorously introduced and many experimental effects are discussed. The specific aspects of neutron reflectivity require separate treatment, given in chapter 5. Chapter 6 turns to X-ray reflectivity by rough multilayers. Eventually, chapter 7 introduces and discusses the by now well-established method of grazing incidence small angle X-ray scattering to investigate nanostructures. For the second edition, the material has been completely reorganized so as to meet the demand for a modern multi-author textbook for PhD students and young researchers. All chapters have further been throughly revised, updated and, where appropriate, suitably augmented. The first edition was been published as Lect. Notes Phys. m58 in the same series.
Other form:Print version: X-ray and neutron reflectivity. 2nd ed. Berlin ; London : Springer, 2009 9783540885870 3540885870