Progress in pattern recognition, image analysis, computer vision, and applications : 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, São Paulo, Brazil, November 8-11, 2010 : proceedings /

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Bibliographic Details
Meeting name:	Iberoamerican Congress on Pattern Recognition (15th : 2010 : São Paulo, Brazil)
Imprint:	Berlin : Springer, 2010.
Description:	1 online resource (xvii, 571 pages) : illustrations.
Language:	English
Series:	Lecture notes in computer science, 0302-9743 ; 6419 LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics Lecture notes in computer science ; 6419. LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
Subject:	Pattern recognition systems -- Congresses. Image processing -- Congresses. Computer vision -- Congresses. Computer vision. Image processing. Pattern recognition systems. Conference papers and proceedings.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11075026

Hidden Bibliographic Details
Varying Form of Title:	CIARP 2010
Other authors / contributors:	Bloch, Isabelle. Cesar, Roberto Marcondes.
ISBN:	9783642166877 3642166873 9783642166860 3642166865
Notes:	Includes bibliographical references and index. Print version record.
Summary:	Annotation This book constitutes the refereed proceedings of the 15th iberoamerican Congress on Pattern Recognition, CIARP 2010, held in Sao Paulo, Brazil, in November 2010. The 70 revised full papers presented were carefully reviewed and selected from 145 submissions. The papers feature current research on mathematical methods and computing techniques for pattern recognition, computer vision, image analysis, and speech recognition, as well as their applications in such diverse areas as robotics, industry, health, entertainment, space exploration, telecommunications, data mining, document analysis, and natural language processing and recognition to name only few of them.
Other form:	Print version: Progress in pattern recognition, image analysis, computer vision, and applications. Berlin : Springer, 2010 9783642166860

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