Progress in pattern recognition, image analysis, computer vision, and applications : 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings /

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Bibliographic Details
Meeting name:	Iberoamerican Congress on Pattern Recognition (16th : 2011 : Pucón, Chile)
Imprint:	Berlin ; New York : Springer, ©2011.
Description:	1 online resource (xviii, 721 pages).
Language:	English
Series:	Lecture notes in computer science, 0302-9743 ; 7042 LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition Lecture notes in computer science ; 7042. LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
Subject:	Pattern recognition systems -- Congresses. Computer vision -- Congresses. Image processing -- Digital techniques -- Congresses. Computer vision. Image processing -- Digital techniques. Pattern recognition systems. Conference papers and proceedings.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11076199

Hidden Bibliographic Details
Varying Form of Title:	CIARP 2011
Other authors / contributors:	San Martin, César. Kim, Sang-Woon.
ISBN:	9783642250859 3642250858 364225084X 9783642250842 9783642250842
Notes:	Includes bibliographical references and author index.
Summary:	This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
Other form:	Print version: Iberoamerican Congress on Pattern Recognition (16th : 2011 : Pucón, Chile). Progress in pattern recognition, image analysis, computer vision, and applications. Berlin ; New York : Springer, ©2011

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