Progress in VLSI design and test : 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings /

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Bibliographic Details
Meeting name:	VDAT (Symposium) (16th : 2012 : Shibpur, India)
Imprint:	Berlin ; New York : Springer, ©2012.
Description:	1 online resource (xxii, 408 pages) : illustrations.
Language:	English
Series:	Lecture notes in computer science, 1611-3349 ; 7373 LNCS sublibrary. SL 1, Theoretical computer science and general issues Lecture notes in computer science ; 7373. LNCS sublibrary. SL 1, Theoretical computer science and general issues.
Subject:	Integrated circuits -- Very large scale integration -- Design and construction -- Congresses. Integrated circuits -- Very large scale integration -- Testing -- Congresses. Integrated circuits -- Very large scale integration -- Design and construction. Integrated circuits -- Very large scale integration -- Testing. Conference papers and proceedings.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11077021

Hidden Bibliographic Details
Varying Form of Title:	VDAT 2012
Other authors / contributors:	Rahaman, Hafizur. Chattopadhyay, Sanatan. Chattopadhyay, Santanu.
ISBN:	9783642314940 3642314945 3642314937 9783642314933 9783642314933
Notes:	Includes bibliographical references and author index. Online resource; title from PDF title page (SpringerLink, viewed Aug. 10, 2012).
Summary:	This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
Other form:	Progress in VLSI design and test
Standard no.:	10.1007/978-3-642-31494-0

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