Hidden Bibliographic Details
Other authors / contributors: | Wagner, Johanna M.
|
ISBN: | 9781617282409 1617282405 9781616689155 1616689153
|
Notes: | Includes bibliographical references and index. English.
|
Summary: | X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and.
|
Other form: | Print version: X-ray photoelectron spectroscopy New York : Nova Science Publishers, c2011. 9781616689155 (hbk.)
|