X-ray photoelectron spectroscopy /

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Bibliographic Details
Imprint:New York : Nova Science Publishers, c2011.
Description:1 online resource.
Language:English
Series:Chemical engineering methods and technology
Chemical engineering methods and technology.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11124106
Hidden Bibliographic Details
Other authors / contributors:Wagner, Johanna M.
ISBN:9781617282409
1617282405
9781616689155
1616689153
Notes:Includes bibliographical references and index.
English.
Summary:X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and.
Other form:Print version: X-ray photoelectron spectroscopy New York : Nova Science Publishers, c2011. 9781616689155 (hbk.)