X-ray photoelectron spectroscopy /
Saved in:
Imprint: | New York : Nova Science Publishers, c2011. |
---|---|
Description: | 1 online resource. |
Language: | English |
Series: | Chemical engineering methods and technology Chemical engineering methods and technology. |
Subject: | |
Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11124106 |
Other authors / contributors: | Wagner, Johanna M. |
---|---|
ISBN: | 9781617282409 1617282405 9781616689155 1616689153 |
Notes: | Includes bibliographical references and index. English. |
Summary: | X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and. |
Other form: | Print version: X-ray photoelectron spectroscopy New York : Nova Science Publishers, c2011. 9781616689155 (hbk.) |
Similar Items
-
Hard x-ray photoelectron spectroscopy (HAXPES) /
Published: (2016) -
X-ray photoelectron spectroscopy /
Published: (1978) -
Handbook of x-ray photoelectron spectroscopy, a reference book of standard data for use in x-ray photoelectron spectroscopy /
Published: (1979) -
Photoelectron spectroscopy : principles and applications /
by: Hüfner, Stefan, 1935-
Published: (1996) -
Photoelectron spectroscopy : principles and applications /
by: Hüfner, Stefan, 1935-
Published: (2003)