X-ray fluorescence spectrometry and related techniques : an introduction /

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Bibliographic Details
Author / Creator:	Marguí, Eva.
Imprint:	[New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2013.
Description:	1 online resource (xv, 142 pages) : illustrations, digital file
Language:	English
Subject:	X-ray spectroscopy. X-ray spectroscopy. Electronic books.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11175249

Hidden Bibliographic Details
Other authors / contributors:	Grieken, R. van (René)
ISBN:	9781606503935 1606503936 9781606503911 160650391X
Notes:	Title from PDF title page (viewed February 22, 2013). Includes bibliographical references (pages 133-138) and index.
Summary:	X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF.
Other form:	Print version: 160650391X 9781606503911
Standard no.:	10.5643/9781606503935

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