System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday /
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Imprint: | Singapore ; River Edge, NJ : World Scientific, ©2001. |
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Description: | 1 online resource (xxvii, 409 pages) : illustrations |
Language: | English |
Series: | Series on quality, reliability & engineering statistics ; v. 5 Series on quality, reliability & engineering statistics ; v. 5. |
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Format: | E-Resource Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11179049 |