System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday /

System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday /

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Bibliographic Details
Imprint:Singapore ; River Edge, NJ : World Scientific, ©2001.
Description:1 online resource (xxvii, 409 pages) : illustrations
Language:English
Series:Series on quality, reliability & engineering statistics ; v. 5
Series on quality, reliability & engineering statistics ; v. 5.
Subject:
Barlow, Richard E.
Barlow, Richard E.
Reliability (Engineering)
System failures (Engineering)
Bayesian statistical decision theory.
Mathematical statistics.
Bayesian statistical decision theory.
Mathematical statistics.
Reliability (Engineering)
System failures (Engineering)
Electronic books.
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11179049
Hidden Bibliographic Details
Other authors / contributors:Hayakawa, Yu.
Irony, Telba.
Xie, M. (Min)
Barlow, Richard E.
ISBN:9789812799548
9812799540
9810248652
9789810248659
Notes:Includes bibliographical references and index.
Print version record.
Summary:This volume is a collection of articles on reliability systems and Bayesian reliability analysis. Written by reputable researchers, the articles are self-contained and are linked with literature reviews and new research ideas. The book is dedicated to Emeritus Professor Richard E Barlow, who is well known for his pioneering research on reliability theory and Bayesian reliability analysis. Contents: System Reliability Analysis: On Regular Reliability Models (J-C Chang et al.); Bounding System Reliability (J N Hagstrom & S M Ross); Large Excesses for Finite-State Markov Chains (D Blackwell); Age.
Other form:Print version: System and Bayesian reliability. Singapore ; River Edge, NJ : World Scientific, ©2001 9810248652 9789810248659

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