Microelectronics failure analysis : desk reference /

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Bibliographic Details
Imprint:	Materials Park, Ohio : ASM International, ©2004.
Description:	1 online resource (xiv, 800 pages) : illustrations
Language:	English
Subject:	Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc. Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc. Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc. Electronics -- Materials -- Testing -- Handbooks, manuals, etc. Electronics -- Materials -- Defects -- Handbooks, manuals, etc. Electronic apparatus and appliances -- Testing. Electronics -- Materials -- Defects. Electronics -- Materials -- Testing. Microelectronics -- Materials -- Testing. Handbooks and manuals. Electronic books.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11185522

Hidden Bibliographic Details
Other authors / contributors:	Electronic Device Failure Analysis Society. Desk Reference Committee. ASM International.
ISBN:	9781615032662 1615032665 9780871708045 0871708043
Notes:	Includes bibliographical references and indexes. Print version record.
Other form:	Print version: Microelectronics failure analysis. Materials Park, Ohio : ASM International, ©2004

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