X-ray diffraction : structure, principles and applications /

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Bibliographic Details
Imprint:New York : Nova Publishers, [2013]
Description:1 online resource.
Language:English
Series:Materials Science and Technologies
Materials science and technologies series.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11203402
Hidden Bibliographic Details
Other authors / contributors:Shih, Kaimin, editor.
ISBN:9781628085938
1628085932
9781628085914
1628085916
Notes:Includes bibliographical references and index.
Description based on print version record; title from PDF title page, viewed (07/13/2020).
Summary:An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m.
Other form:Print version: X-ray diffraction New York : Nova Publishers, [2013] 9781628085914 (hardcover)