X-ray diffraction : structure, principles and applications /

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Bibliographic Details
Imprint:New York : Nova Publishers, [2013]
Description:1 online resource.
Language:English
Series:Materials Science and Technologies
Materials science and technologies series.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11203402
Hidden Bibliographic Details
Other authors / contributors:Shih, Kaimin, editor.
ISBN:9781628085938
1628085932
9781628085914
1628085916
Notes:Includes bibliographical references and index.
Description based on print version record; title from PDF title page, viewed (07/13/2020).
Summary:An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m.
Other form:Print version: X-ray diffraction New York : Nova Publishers, [2013] 9781628085914 (hardcover)

MARC

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490 1 |a Materials Science and Technologies 
504 |a Includes bibliographical references and index. 
588 |a Description based on print version record; title from PDF title page, viewed (07/13/2020). 
505 0 |a ""X-RAY DIFFRACTION: STRUCTURE, PRINCIPLES AND APPLICATIONS""; ""X-RAY DIFFRACTION: STRUCTURE, PRINCIPLES AND APPLICATIONS""; ""Library of Congress Cataloging-in-Publication Data""; ""CONTENTS""; ""PREFACE""; ""Chapter 1: DEVELOPMENT AND APPLICATION OF X-RAY DIFFRACTION TECHNIQUE FOR SINGLE CRYSTALS""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. DEVELOPMENT OF SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE""; ""3. CRYSTAL GROWTH AND SELECTION""; ""4. DATA COLLECTION, ANALYSIS AND PRESENTATION""; ""5. APPLICATIONS OF THE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE""; ""CONCLUSION""; ""REFERENCES"" 
505 8 |a ""Chapter 2: STRUCTURE CHARACTERIZATION OF COORDINATION POLYMERS BY X-RAY DIFFRACTION DATA""""ABSTRACT""; ""1. X-RAY DIFFRACTION""; ""2. SUPRAMOLECULAR CHEMISTRY""; ""3. COORDINATION POLYMERS""; ""ACKNOWLEDGMENTS""; ""REFERENCES""; ""Chapter 3: X-RAY DIFFRACTION ANALYSIS OF MAGNETIC SHAPE MEMORY ALLOYS""; ""ABSTRACT""; ""INTRODUCTION""; ""METHODOLOGY""; ""ANALYSIS AND RESULTS""; ""CONCLUSION""; ""REFERENCES""; ""Chapter 4: CRYSTAL STRUCTURES OF NEW RARE EARTH INTERMETALLIC COMPOUNDS""; ""ABSTRACT""; ""1. DISCOVERY OF NEW COMPOUNDS""; ""2. EXPERIMENTAL METHODS""; ""3. STRUCTURE DETERMINATION"" 
505 8 |a ""4. STRUCTURES OF SOME NEW RARE EARTH COMPOUNDS""""5. LATTICE THERMAL EXPANSION OF RARE EARTH COMPOUNDS""; ""ACKNOWLEDGMENTS""; ""REFERENCES""; ""Chapter 5: APPLICATION OF QUANTITATIVE X-RAY DIFFRACTION IN GEOENVIRONMENTAL PROBLEMS: OVERVIEW AND CASE STUDIES""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. BACKGROUND ON QUANTITATIVE XRD""; ""3. CASE STUDIES""; ""CONCLUSION AND OUTLOOK""; ""REFERENCES""; ""Chapter 6: QUANTITATIVE X-RAY DIFFRACTION FOR REVEALING THE THERMAL INCORPORATION BEHAVIOR OF LEAD""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. REFINEMENT FOR LEAD CERAMICS"" 
505 8 |a ""3. THERMAL INCORPORATION BEHAVIOR FOR LEAD BY DIFFERENT PRECURSORS""""CONCLUSION""; ""REFERENCES""; ""Chapter 7: X-RAY ANALYSIS OF METAL OXIDE-METAL CORE-SHELL NANOPARTICLES""; ""ABSTRACT""; ""1. INTRODUCTION""; ""2. EXPERIMENTAL""; ""3. RESULTS AND DISCUSSION""; ""CONCLUSION""; ""ACKNOWLEDGMENTS""; ""REFERENCES""; ""Chapter 8: CHARACTERIZATION OF MATERIALS OBTAINED BY AN INNOVATIVE INTEGRATED SYNTHESIS METHOD AIMED TO THE HYDROGEN TECHNOLOGY""; ""ABSTRACT""; ""LIST OF SYMBOLS""; ""1. INTRODUCTION""; ""2. GENERATION OF THE IDEA""; ""3. DEVELOPMENT OF THE FIRST STAGE: SYNTHESIS METHOD"" 
505 8 |a ""4. DEVELOPMENT OF THE SECOND STAGE: MODIFICATION OF MATERIALS""""5. CHARACTERIZATION OF MATERIALS""; ""6. APPLICATION TO TCH""; ""7. COMPOSITES AIMED TO APPLICATION TO GPH""; ""CONCLUSION""; ""ACKNOWLEDGMENTS""; ""REFERENCES""; ""Chapter 9: DEPTH-RESOLVED MEASUREMENT OF THE 3D RESIDUAL STRESS STATE IN SURFACE ENGINEERED ALUMINIUM BY SYNCHROTRON DIFFRACTION""; ""ABSTRACT""; ""1. INTRODUCTION""; ""EXPERIMENTAL TECHNIQUE""; ""3. CASE STUDY""; ""4. RESULTS""; ""5. TRIAXIAL STRESS DISTRIBUTION""; ""CONCLUSION""; ""ACKNOWLEDGMENTS""; ""REFERENCES"" 
520 |a An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m. 
650 0 |a Materials  |x Microscopy.  |0 http://id.loc.gov/authorities/subjects/sh85082081 
650 0 |a X-rays  |x Diffraction.  |0 http://id.loc.gov/authorities/subjects/sh85148750 
650 0 |a X-ray crystallography.  |0 http://id.loc.gov/authorities/subjects/sh85148730 
650 0 |a Transmission electron microscopy.  |0 http://id.loc.gov/authorities/subjects/sh93001918 
650 7 |a SCIENCE  |x Physics  |x Crystallography.  |2 bisacsh 
650 7 |a Materials  |x Microscopy.  |2 fast  |0 (OCoLC)fst01011856 
650 7 |a Transmission electron microscopy.  |2 fast  |0 (OCoLC)fst01154860 
650 7 |a X-ray crystallography.  |2 fast  |0 (OCoLC)fst01181820 
650 7 |a X-rays  |x Diffraction.  |2 fast  |0 (OCoLC)fst01181858 
655 0 |a Electronic books. 
655 4 |a Electronic books. 
655 4 |a 7  |a Electronic books. 
700 1 |a Shih, Kaimin,  |e editor. 
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