Microelectronic failure analysis : desk reference : 2001 supplement /

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Bibliographic Details
Imprint:	Materials Park, OH : ASM International, ©2001.
Description:	1 online resource (v, 171 pages) : illustrations
Language:	English
Subject:	Electronics -- Materials -- Testing -- Handbooks, manuals, etc. Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc. Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc. Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc. Semiconductors -- Defects -- Handbooks, manuals, etc. Electronic apparatus and appliances -- Testing. Electronics -- Materials -- Testing. Microelectronics -- Materials -- Defects. Microelectronics -- Materials -- Testing. Semiconductors -- Defects. Electronic books. Handbooks and manuals.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11220611

Hidden Bibliographic Details
Other authors / contributors:	Electronic Device Failure Analysis Society.
ISBN:	9781615032655 1615032657 9780871707451 0871707454
Notes:	Includes bibliographical references and index. Restrictions unspecified Electronic reproduction. [Place of publication not identified] : HathiTrust Digital Library, 2010. Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 digitized 2010 HathiTrust Digital Library committed to preserve Print version record.
Other form:	Print version: Microelectronic failure analysis. Materials Park, OH : ASM International, ©2001

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