Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

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Bibliographic Details
Imprint:New Jersey : World Scientific, [2014]
©2014
Description:1 online resource (379 pages) : illustrations
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11223925
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Other authors / contributors:Nakamura, Syouji.
Qian, Cun Hua.
Chen, Mingchih.
ISBN:9789814571944
9814571946
9814571938
9789814571937
9789814571937
Notes:Includes bibliographical references.
Online resource; title from PDF title page (ebrary, viewed February 5, 2014).
Summary:Reliability modeling has been a major concern for engineers and managers engaged in high quality system designs. This book presents the recent advancement in reliability theory and reliability engineering. Starting from maintenance policies, the book introduces reliability analysis to systems using stochastic processes to study their optimization problems. In this book, the authors will illustrate how these techniques of reliability are applied to solve optimization problems in computer, information and network systems.
Other form:Print version: Reliability modeling with applications. New Jersey : World Scientific, [2014]