Hidden Bibliographic Details
| ISBN: | 9781630813710
1630813710
9781630810566
1630810568
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| Notes: | Includes bibliographical references and index.
Print version record.
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| Summary: | This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.
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| Other form: | Print version: Lourandakis, Errikos, 1981- On-wafer microwave measurements and de-embedding. Boston ; London : Artech House, [2016] 9781630810566
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