On-wafer microwave measurements and de-embedding /

On-wafer microwave measurements and de-embedding /

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Bibliographic Details
Author / Creator:	Lourandakis, Errikos, 1981- author.
Imprint:	Boston : Artech House, [2016]
Description:	1 online resource (xxvii, 216 pages) : illustrations
Language:	English
Series:	Artech House Microwave Library Artech House microwave library.
Subject:	Microwave integrated circuits. Microwave measurements. Microwave integrated circuits. Microwave measurements. Electronic books.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/11307057

Hidden Bibliographic Details
ISBN:	9781630813710 1630813710 9781630810566 1630810568
Notes:	Includes bibliographical references and index. Print version record.
Summary:	This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.
Other form:	Print version: Lourandakis, Errikos, 1981- On-wafer microwave measurements and de-embedding. Boston ; London : Artech House, [2016] 9781630810566

Description
Physical Description:	1 online resource (xxvii, 216 pages) : illustrations
Bibliography:	Includes bibliographical references and index.
ISBN:	9781630813710 1630813710 9781630810566 1630810568