Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /
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| Meeting name: | International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th : 2000 : Upton, N.Y.) |
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| Imprint: | Melville, N.Y. : American Institute of Physics, 2001. |
| Description: | xiv, 304 pages : illustrations ; 25 cm. |
| Language: | English |
| Series: | AIP conference proceedings, 0094-243X ; v. 572 AIP conference proceedings ; no. 572. |
| Subject: | |
| Format: | E-Resource Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/11321525 |