Understanding faults : detecting, dating, and modeling /

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Bibliographic Details
Imprint:Amsterdam, Netherlands : Elsevier, [2020].
Description:1 online resource.
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/11981630
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Other authors / contributors:Tanner, David, editor.
Brandes, Christian, editor.
ISBN:9780128159859
0128159863
9780128159866
Notes:Includes index.
Includes bibliographical references and index.
Online resource; title from PDF title page (ScienceDirect, viewed October 22, 2019).
Other form:Print version: Tanner, David Colin Understanding Faults : Detecting, Dating, and Modeling San Diego : Elsevier,c2019 9780128159859