Without a margin for error : urban immigrant English language learners in STEM /

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Bibliographic Details
Author / Creator:Heyman, Jeremy B., author.
Imprint:Leiden, The Netherlands : Brill Sense, [2019]
©2019
Description:1 online resource (ix, 158 pages)
Language:English
Series:Transgressions : cultural studies and education, 2214-9732 ; volume 131
Transgressions (Rotterdam, Netherlands) ; v. 131.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12541887
Hidden Bibliographic Details
Other authors / contributors:Emdin, Christopher, writer of foreword.
ISBN:9789004389472
9004389474
9789004376144
9004376143
9789004376137
9004376135
Notes:Includes bibliographical references (pages 153-158)
Print version record
Summary:Heyman chronicles the journeys of young adults in an under-served urban community who are new to the English language into STEM fields from high school through college in an effort to change the equation of who should be considered a legitimate contender for success in STEM fields
Other form:Print version: Heyman, Jeremy B. Without a margin for error. Leiden, The Netherlands : Brill Sense, 2019 9789004376144
Description
Summary:In Without a Margin for Error , the author chronicles the journeys of young adults in an under-served urban community who are new to the English language into STEM (science, technology, engineering, and mathematics-related) fields from high school through college. He distills lessons, themes, and policy recommendations from the trails blazed by these students toward altering the status quo around college access and STEM success for often-marginalized but highly resilient young adults with much to contribute to their new nation, their communities, and the world. While drawing on a critical ethnography of over three dozen inspiring young adults, seven students are chronicled in greater depth to bring to life crucial conversations for redefining college readiness, access, and success in STEM fields.
Physical Description:1 online resource (ix, 158 pages)
Bibliography:Includes bibliographical references (pages 153-158)
ISBN:9789004389472
9004389474
9789004376144
9004376143
9789004376137
9004376135
ISSN:2214-9732
;