From traditional fault tolerance to blockchain /

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Bibliographic Details
Author / Creator:Zhao, Wenbing, Ph.D., author.
Imprint:Hoboken, NJ : John Wiley & Sons, Inc., [2021]
Description:1 online resource () : illustrations (some color)
Language:English
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/12967377
Hidden Bibliographic Details
ISBN:9781119682080
1119682088
9781119682127
1119682126
9781119682110
1119682118
9781119681953
Notes:Includes bibliographical references and index.
Description based on online resource; title from digital title page (viewed on April 19, 2022).
Other form:Print version: Zhao, Wenbing. From traditional fault tolerance to blockchain Hoboken, NJ : Wiley-Scrivener, 2021 9781119681953
Standard no.:10.1002/9781119682127