Hidden Bibliographic Details
| Other authors / contributors: | Baturin, Alexey A.
Mikhailov, Anton I.
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| ISBN: | 1527543897
9781527543898
1527542467
9781527542464
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| Notes: | Includes bibliographical references (pages 231-237).
Online resource; title from digital title page (viewed on February 25, 2020).
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| Summary: | This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi.
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| Other form: | Print version: Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. Newcastle-upon-Tyne : Cambridge Scholars Publisher, ©2019 9781527542464
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