$Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /$

Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /

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Bibliographic Details
Author / Creator:	Mikhailov, Igor F.
Imprint:	Newcastle-upon-Tyne : Cambridge Scholars Publisher, 2020. ©2020
Description:	1 online resource (249 pages)
Language:	English
Subject:	Fluorescence spectroscopy. X-ray spectroscopy. X-rays -- Diffraction. Materials -- Analysis. Spectrometry, Fluorescence Spectrometry, X-Ray Emission X-Ray Diffraction Fluorescence spectroscopy. Materials -- Analysis. X-ray spectroscopy. X-rays -- Diffraction.
Format:	E-Resource Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/13456472

Hidden Bibliographic Details
Other authors / contributors:	Baturin, Alexey A. Mikhailov, Anton I.
ISBN:	1527543897 9781527543898 1527542467 9781527542464
Notes:	Includes bibliographical references (pages 231-237). Online resource; title from digital title page (viewed on February 25, 2020).
Summary:	This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi.
Other form:	Print version: Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. Newcastle-upon-Tyne : Cambridge Scholars Publisher, ©2019 9781527542464

Description
Physical Description:	1 online resource (249 pages)
Bibliography:	Includes bibliographical references (pages 231-237).
ISBN:	1527543897 9781527543898 1527542467 9781527542464