Metrology for 5G and emerging wireless technologies /

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Bibliographic Details
Imprint:Stevenage : Institution of Engineering & Technology, 2021.
©2022
Description:1 online resource : illustrations
Language:English
Series:IET telecommunications series ; 99
IET telecommunications series ; 99.
Subject:
Format: E-Resource Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/13515789
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Other authors / contributors:Loh, Tian Hong editor
ISBN:1839532793
9781839532795
9781839532788
1839532785
Notes:Includes bibliographical references and index.
Summary:This book is the first to focus on metrology for current and future wireless communication technologies. It presents an overview of metrological capabilities and testbeds developed under several UK, EU and international programmes as well as other international efforts for 5G and beyond
Other form:Print version: Loh, Tian Hong Metrology for 5G and Emerging Wireless Technologies Stevenage : Institution of Engineering & Technology,c2022 9781839532788