Thermal resistance measurements/

Saved in:

Bibliographic Details
Author / Creator:	Oettinger, Frank F.
Imprint:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1990.
Description:	v, 72 p. : ill. ; 28 cm.
Language:	English
Series:	NIST special publication 400-86 Semiconductor measurement technology
Subject:	Power transistors -- Thermal properties Integrated circuits -- Testing. Temperature measurements Integrated circuits -- Testing. Power transistors -- Thermal properties. Temperature measurements.
Format:	Microform U.S. Federal Government Document Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/1457067

Hidden Bibliographic Details
Other authors / contributors:	Blackburn, David L.
Notes:	"July 1990." Includes bibliographical references (p. 68-72). Microfiche. Washington, D. C. : U.S. G.P.O, 1992. 1 microfiche : negative ; 11 x 15 cm.
Govt.docs classification:	C 13.10:400-86

Similar Items