Thermal resistance measurements/
Saved in:
Author / Creator: | Oettinger, Frank F. |
---|---|
Imprint: | Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1990. |
Description: | v, 72 p. : ill. ; 28 cm. |
Language: | English |
Series: | NIST special publication 400-86 Semiconductor measurement technology |
Subject: | |
Format: | Microform U.S. Federal Government Document Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1457067 |
Other authors / contributors: | Blackburn, David L. |
---|---|
Notes: | "July 1990." Includes bibliographical references (p. 68-72). Microfiche. Washington, D. C. : U.S. G.P.O, 1992. 1 microfiche : negative ; 11 x 15 cm. |
Govt.docs classification: | C 13.10:400-86 |
Similar Items
-
Thermal resistance measurements on power transistors /
by: Rubin, Sherwin
Published: (1979) -
Designing with TTL integrated circuits.
Published: (1971) -
Low power and low voltage circuit design with the FGMOS transistor /
by: Rodriguez-Villegas, Esther
Published: (2006) -
Solid-state electronics
by: Rutkowski, George B.
Published: (1972) -
Principles of transistor circuits.
by: Shea, Richard F.
Published: (1953)