Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /

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Bibliographic Details
Imprint:Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1994.
Description:1 v. (various pagings) : ill.
Language:English
Series:Semiconductor measurement technology
NIST special publication ; 400-94
Subject:
Format: Microform U.S. Federal Government Document Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/1819077
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Other authors / contributors:Seiler, David G.
National Institute of Standards and Technology (U.S.)
Notes:Distributed to depository libraries in microfiche.
Shipping list no.: 94-0562-M.
"April 1994."
Includes bibliographical references.
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1994]. 3 microfiches : negative.
GPO item no.:0247 (MF)
Govt.docs classification:C 13.10:400-94

Regenstein, B Level, Science Microforms

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Holdings details from Regenstein, B Level, Science Microforms
Call Number: microfc TL1200.I477 1994
c.1 Available Loan period: standard loan  Need help? - Ask a Librarian