Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites /
Saved in:
Imprint: | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1994. |
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Description: | 1 v. (various pagings) : ill. |
Language: | English |
Series: | Semiconductor measurement technology NIST special publication ; 400-94 |
Subject: | |
Format: | Microform U.S. Federal Government Document Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/1819077 |
Regenstein, B Level, Science Microforms
Call Number: |
microfc TL1200.I477 1994
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c.1 | Available Loan period: standard loan Need help? - Ask a Librarian |