Measurement of transistor scattering parameters /

Measurement of transistor scattering parameters /

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Bibliographic Details
Author / Creator:	Rogers, George J.
Imprint:	[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
Description:	iv, 48 p. : ill. ; 26 cm.
Language:	English
Series:	Semiconductor measurement technology. NBS special publication 400-5
Subject:	Transistors -- Testing. Electronic measurements Electronic measurements. Transistors -- Testing.
Format:	U.S. Federal Government Document Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/268834

Hidden Bibliographic Details
Other authors / contributors:	Sawyer, David E. Jesch, Ramon L.
ISBN:	$1.10
Notes:	"Jointly sponsored by the National Bureau of Standards and the Air Force Weapons Laboratory." Includes bibliographical references.

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Call Number:	QC100.U524 no.400-5
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