Alphabetical index of x-ray diffraction patterns (covering original set of cards).

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Bibliographic Details
Corporate author / creator:American Society for Testing Materials
Imprint:Philadelphia, American Society for Testing Materials, 1945.
Description:108 p. illus., tables
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/3485167

Crerar, Lower Level, Dewey Collection

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Holdings details from Crerar, Lower Level, Dewey Collection
Call Number: 620.112 V501
c.1 Available Loan period: standard loan  Scan and Deliver Request for Pickup Need help? - Ask a Librarian