Alphabetical index of x-ray diffraction patterns (covering original set of cards).
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Corporate author / creator: | American Society for Testing Materials |
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Imprint: | Philadelphia, American Society for Testing Materials, 1945. |
Description: | 108 p. illus., tables |
Language: | English |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/3485167 |
Crerar, Lower Level, Dewey Collection
Call Number: |
620.112 V501
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c.1 | Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian |