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00000nam a2200000Ia 4500 |
001 |
3485167 |
003 |
ICU |
005 |
19981210205100.0 |
008 |
871113s1945 paua 000 0 eng d |
035 |
|
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|a (OCoLC)16977233
|
040 |
|
|
|a NSI
|c NSI
|d CGU
|
049 |
|
|
|a CGUA
|
090 |
|
|
|a QD945
|b .A5 1945
|
110 |
2 |
|
|a American Society for Testing Materials
|
245 |
0 |
0 |
|a Alphabetical index of x-ray diffraction patterns
|b (covering original set of cards).
|
260 |
|
|
|a Philadelphia,
|b American Society for Testing Materials,
|c 1945.
|
300 |
|
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|a 108 p.
|b illus., tables
|
336 |
|
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|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
650 |
|
0 |
|a X-rays
|x Diffraction
|x Tables.
|
650 |
|
7 |
|a X-rays
|x Diffraction.
|2 fast
|0 http://id.worldcat.org/fast/fst01181858
|
655 |
|
7 |
|a Tables.
|2 fast
|0 http://id.worldcat.org/fast/fst01423914
|
929 |
|
|
|a retrocon
|
999 |
f |
f |
|i 87734b69-ddb0-5c9c-8b92-efc3a72ffe85
|s 6de1bbdc-7ed9-579c-92eb-87b073473c1b
|
928 |
|
|
|t Dewey Decimal classification
|a 620.112 V501
|l JCL
|c JCL-SciDDC
|i 6224116
|
927 |
|
|
|t Dewey Decimal classification
|a 620.112 V501
|l JCL
|c JCL-SciDDC
|e CRERAR
|b 087145548
|i 5883405
|