Alphabetical index of x-ray diffraction patterns (covering original set of cards).

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Bibliographic Details
Corporate author / creator:American Society for Testing Materials
Imprint:Philadelphia, American Society for Testing Materials, 1945.
Description:108 p. illus., tables
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/3485167

MARC

LEADER 00000nam a2200000Ia 4500
001 3485167
003 ICU
005 19981210205100.0
008 871113s1945 paua 000 0 eng d
035 |a (OCoLC)16977233 
040 |a NSI  |c NSI  |d CGU 
049 |a CGUA 
090 |a QD945  |b .A5 1945 
110 2 |a American Society for Testing Materials 
245 0 0 |a Alphabetical index of x-ray diffraction patterns  |b (covering original set of cards). 
260 |a Philadelphia,  |b American Society for Testing Materials,  |c 1945. 
300 |a 108 p.  |b illus., tables 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
650 0 |a X-rays  |x Diffraction  |x Tables. 
650 7 |a X-rays  |x Diffraction.  |2 fast  |0 http://id.worldcat.org/fast/fst01181858 
655 7 |a Tables.  |2 fast  |0 http://id.worldcat.org/fast/fst01423914 
929 |a retrocon 
999 f f |i 87734b69-ddb0-5c9c-8b92-efc3a72ffe85  |s 6de1bbdc-7ed9-579c-92eb-87b073473c1b 
928 |t Dewey Decimal classification  |a 620.112 V501  |l JCL  |c JCL-SciDDC  |i 6224116 
927 |t Dewey Decimal classification  |a 620.112 V501  |l JCL  |c JCL-SciDDC  |e CRERAR  |b 087145548  |i 5883405