Life testing and reliability estimation /

Life testing and reliability estimation /

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Bibliographic Details
Author / Creator:	Sinha, S. K. (Snehesh Kumar)
Imprint:	New York : Wiley, c1980.
Description:	vi, 196 p. : graphs ; 25 cm.
Language:	English
Subject:	Failure time data analysis Reliability (Engineering) Accelerated life testing. Failure time data analysis. Reliability (Engineering)
Format:	Print Book
URL for this record:	http://pi.lib.uchicago.edu/1001/cat/bib/432688

Hidden Bibliographic Details
Other authors / contributors:	Kale, B. K. (Balvant Keshav), 1933- joint author.
ISBN:	0470269111
Notes:	"A Halsted Press book." Includes index. Bibliography: p. [189]-194. committed to retain 20170930 20421213 HathiTrust

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