SIGMETRICS

SIGMETRICS

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Bibliographic Details
Meeting name:International Conference on Measurement and Modeling of Computer Systems.
Imprint:New York, N.Y. : Association for Computing Machinery 1973-.
Language:English
Subject:
Electronic digital computers -- Evaluation -- Congresses.
Digital computer simulation -- Congresses.
Digital computer simulation.
Electronic digital computers -- Evaluation.
Conference papers and proceedings.
Format: E-Resource Journal
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/4426677
Hidden Bibliographic Details
Varying Form of Title:Joint International Conference on Measurement and Modeling of Computer Systems
Proceedings of the ... ACM Sigmetrics International Conference on Measurement and Modeling of Computer Systems
ACM Sigmetrics
Other authors / contributors:ACM-Sigmetrics.
ACM Digital Library.
Date / volume:Coverage as of 1973-
Notes:Title from conference proceedings series home page (viewed May 9, 2001).
Subscription and registration required for access.
Citations in HTML; full-text in PDF file format.
Also available in print.
System requirements: Internet connectivity, World Wide Web browser, and Adobe Acrobat Reader.
Mode of access: World Wide Web.

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