Defect and microstructure analysis by diffraction /
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| Author / Creator: | Snyder, R. L. (Robert L.), 1941- |
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| Imprint: | Oxford ; New York : Oxford University Press, 1999. |
| Description: | xxii, 785 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | International Union of Crystallography monographs on crystallography ; 10 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4675108 |
Crerar, Lower Level, Bookstacks
| Call Number: |
QD945 .S58 1999
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| c.1 | Available Loan period: standard loan Scan and Deliver Request for Pickup Need help? - Ask a Librarian |
