Defect and microstructure analysis by diffraction /
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| Author / Creator: | Snyder, R. L. (Robert L.), 1941- |
|---|---|
| Imprint: | Oxford ; New York : Oxford University Press, 1999. |
| Description: | xxii, 785 p. : ill. ; 24 cm. |
| Language: | English |
| Series: | International Union of Crystallography monographs on crystallography ; 10 |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4675108 |
Table of Contents:
- List of contributors
- Abbreviations
- 1. Introduction to defect and microstructure analysis or the analysis of real structure, Jaroslav Fiala and Robert L. Snyder
- Part I. Fundamentals of defect analysis by diffraction
- 2. Some applications of the kinematical theory of X-ray diffraction
- 3. Profile fitting and analytical functions
- 4. Effects of instrument function, crystallite size, and strain on reflection profiles
- 5. Use of pattern decomposition or simulation to study microstructure: theoretical considerations
- 6. Classical treatment of line profiles influenced by strain, small size, and stacking faults
- 7. Voigt function model in diffraction-line broadening analysis
- 8. X-ray analysis of precipitation-related crystals with dislocation substructure
- 9. Analytic functions describing line profiles influenced by size distribution, strain, and stacking faults
- 10. The dislocation-based model of strain broadening in X-ray line profile analysis
- 11. Diffraction-line broadening analysis of dislocation configurations
- 12. Diffraction-line broadening analysis of strain fields in crystalline solids
- 13. Paracrystallinity
- 14. The model of the paracrystal and its application to polymers
- 15. Effect of planar defects in crystals on the position of powder diffraction lines
- 16. Effect of stacking disorder on the profile of the powder diffraction line
- Part II. Experimental techniques
- 17. Crystallite statistics and accuracy in powder diffraction intensity measurements
- 18. Reciprocal space mapping and ultra-high resolution diffraction of polycrystalline materials
- Part III. Macrostress
- 19. X-Ray analysis of the inhomogenous stress state
- Part IV. Texture
- 20. Texture and structure of polycrystals
- 21. Texture effects in powder diffraction and their correction by simple empirical functions
- Part V. Whole-pattern fitting
- 22. Accounting for size and microstrain in whole-powder pattern fitting
- 23. Modelling of texture in whole-pattern fitting
- 24. A new whole-powder pattern-fitting approach
- 25. The role of whole-pattern databases in materials science
- Part VI. Restoring physical patterns from the observed variables
- 26. Restoration and preprocessing of physical profiles from measured data
- 27. Towards higher resolution: a mathematical approach
- Part VII. Applications
- 28. Use of pattern decomposition to study microstructure: practical aspects and applications
- 29. X-ray diffraction broadening effects in materials characterization
- 30. Crystal size and distortion parameters in fibres using Wide-Angle X-ray Scattering (WAXS)
- 31. Pressure-induced profile change of energy-dispersive diffraction using synchrotron radiation
- Index
