Analysis of residual stress by diffraction using neutron and synchrotron radiation /
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| Imprint: | London ; New York : Taylor & Francis, 2003. |
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| Description: | xi, 354 p. : ill. ; 26 cm. |
| Language: | English |
| Subject: | |
| Format: | Print Book |
| URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4867918 |
Mansueto
| Call Number: |
TA417.6.A53 2003
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| c.1 | Available Loan period: standard loan Request from Mansueto Scan and Deliver Need help? - Ask a Librarian |
