Analysis of residual stress by diffraction using neutron and synchrotron radiation /
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Imprint: | London ; New York : Taylor & Francis, 2003. |
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Description: | xi, 354 p. : ill. ; 26 cm. |
Language: | English |
Subject: | |
Format: | Print Book |
URL for this record: | http://pi.lib.uchicago.edu/1001/cat/bib/4867918 |
Table of Contents:
- List of contributors
- Preface
- Acknowledgements
- Part 1. General applications of neutron and synchrotron radiation to materials research
- 1. The use of neutrons for materials characterization
- 2. The use of synchrotron radiation for materials research
- Part 2. Methods and problems in residual stress determination by diffraction
- 3. Calculation of residual stress from measured strain
- 4. Characterization of macrostresses
- 5. Study of second- and third-order stresses
- 6. The effect of texture on residual stress measurement and interpretation
- 7. Anisotropy of lattice strain response
- Part 3. Measurement techniques
- 8. Neutron diffraction using a constant wavelength
- 9. Neutron pulsed source instrumentation
- 10. Use of synchrotron X-ray radiation for stress measurement
- 11. The use of neutron transmission for materials analysis
- Part 4. Areas of study
- 12. Strain mapping
- 13. Study of stress gradients using synchrotron X-ray diffraction
- 14. Near-surface stress measurement using neutron diffraction
- Part 5. Applications
- 15. Shot peening
- 16. Composite materials
- 17. Residual stress analysis in monocrystals using capillary optics
- 18. Neutron residual stress measurement in welds
- 19. Materials for nuclear fusion applications
- 20. Residual stresses in ceramic materials
- Index