Analysis of residual stress by diffraction using neutron and synchrotron radiation /

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Bibliographic Details
Imprint:London ; New York : Taylor & Francis, 2003.
Description:xi, 354 p. : ill. ; 26 cm.
Language:English
Subject:
Format: Print Book
URL for this record:http://pi.lib.uchicago.edu/1001/cat/bib/4867918
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Other authors / contributors:Fitzpatrick, M. E. (Michael E.)
Lodini, Alain.
ISBN:0415303974
Notes:Includes bibliographical references and index.
Table of Contents:
  • List of contributors
  • Preface
  • Acknowledgements
  • Part 1. General applications of neutron and synchrotron radiation to materials research
  • 1. The use of neutrons for materials characterization
  • 2. The use of synchrotron radiation for materials research
  • Part 2. Methods and problems in residual stress determination by diffraction
  • 3. Calculation of residual stress from measured strain
  • 4. Characterization of macrostresses
  • 5. Study of second- and third-order stresses
  • 6. The effect of texture on residual stress measurement and interpretation
  • 7. Anisotropy of lattice strain response
  • Part 3. Measurement techniques
  • 8. Neutron diffraction using a constant wavelength
  • 9. Neutron pulsed source instrumentation
  • 10. Use of synchrotron X-ray radiation for stress measurement
  • 11. The use of neutron transmission for materials analysis
  • Part 4. Areas of study
  • 12. Strain mapping
  • 13. Study of stress gradients using synchrotron X-ray diffraction
  • 14. Near-surface stress measurement using neutron diffraction
  • Part 5. Applications
  • 15. Shot peening
  • 16. Composite materials
  • 17. Residual stress analysis in monocrystals using capillary optics
  • 18. Neutron residual stress measurement in welds
  • 19. Materials for nuclear fusion applications
  • 20. Residual stresses in ceramic materials
  • Index